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3D IC Track
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Standardizing Wafer-level HVM PIC testing Using V93000-Triton Photonics Solution
Advantest / Formfactor
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Abstract
The V93000-TRITON is a test cell that enables repeatable, low-loss wafer-level coupling and the fastest possible test throughput. By leveraging the proven V93000 SmarTest software ecosystem and automation capabilities, the solution supports high-volume testing of both optical and electrical devices, making it ideal for HPC, AI, and data center applications involving CPO and OIO interconnects.
This paper exemplifies the value of the solution by discussing a real life production setup and testprogram with characteristic measurement results.
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